Atomic Force Microscopy

Two atomic force microscopes are available for the morphological characterization of nanostructured surfaces. The Bruker Multimode 8 AFM features an electrochemical cell for characterizing surface structure in a liquid or electrochemical environment.

Bruker Multimode 8 AFM

  • AS-12 Scanner
    • 2.5 µm Z range
    • 10µm X 10µm XY range
    • Probe holder for AFM in air
  • Nanoscope V controller
  • Electrochemical Cell
    • Liquid probe holder with electrochemical contacts
    • Bruker Universal Biopotentiostat

ec-afm

Bruker Multimode 8 AFM with electrochemical cell.

Park Scientific Instruments Autoprobe CP

  • Scanner
    • 5 µm standard configuration
    • 100 µm multitask configuration
    • Magnetic and non-magnetic sample holders
  • Probe head for
    • Atomic Force Microscopy
    • Magnetic Force Microscopy
    • Force Modulation Microscopy
    • Phase Detection Microscopy

park afm

Park Autoprobe CP AFM.