Magnetic Force Microscopy

Our Solver HV-2 allows for scanning prope microscopy under ultra high vacuum conditions. This system can be used for magnetic force miscoscopy (MFM) investigations of magnetic surfaces, magnetization reversal, and magnetic domains.

SPM Sover HV-2

  • Sample dimensions up to 10×10 mm
  • Scanning range 100×100×10 μm (+/- 10%)
  • Vacuum System: Residual pressure 7x10-8 mbar
  • Working temperatures:
    • Up to 420 K
    • Down to 110 K (nitrogen)
    • Down to 50 K (helium)
  • Electromagnet
    • Up to 0.12 T Gap 18 mm
    • Up to 0.2 T Gap 7 mm
  • Microscopies: STM, AFM, LFM, MFM, EFM, SCM, KPM, SRI, AFAM
  • Spectroscopies: AFM, STM, LBH, LDOS, AFAM, Contact Resonance Spectroscopy
  • Lithographies: AFM (Force (scratching + dynamic plowing) and Current (dc + ac)), STM
  • Nano-manipulations: Contact Force


Solver HV-2 magnetic force microscope.